Publications

PAPERS

1. Marko Andjelkovic, Fabian Vargas, Milos Krstic, Luigi Dilillo, Alain Michez, Frederic Wrobel, Davide Bertozzi, Mikel Lujan, Christos Georgakidis, Nikolaos Chatzivangelis, Katerina Tsilingiri, Nikolaos Zazatis, Georgios I Paliaroutis, Pelopidas Tsoumanis, Christos Sotiriou, “Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT)”, Design, Automation & Test in Europe Conference (DATE 2025), Published: [Official Link, Open Access Link] 
2. Marko Andjelkovic, Junchao Chen, Jelisaveta Aleksic, Vishnu Padmakumar, Milos Marjanovic, Nikolaos Zazatis, Trupti Ranjan Lenka, Danijel Dankovic, Christos Sotiriou, Fabian Vargas, “ Prediction of Single Event Transient Propagation Using Machine Learning Models”, 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), Published: [Official Link, Open Access Link] 
3. Nikolaos Chatzivangelis, Nikolaos Zazatis, Wesley Grignani, Georgios-Ioannis Paliaroutis, Douglas A. Santos, Carolina Imianosky, Maria Kastriotou, Carlo Cazzaniga, Frédéric Wrobel, Alessandro Veronesi, Christos Sotiriou, Marko Andjelkovic, Fabian L. Vargas, Davide Bertozzi, Luigi Dilillo, Carolina Imianosky, Maria Kastriotou, Carlo Cazzaniga, Frédéric Wrobel, Alessandro Veronesi, Christos Sotiriou, Marko Andjelkovic, Fabian L. Vargas, Davide Bertozzi, Luigi Dilillo, “Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments”, 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Published: [Official Link, Open Access Link]  
4. Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros, “Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction”, 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Published: [Official Link, Open Access Link]  
5. Alexandra Takou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Nestor Evmorfopoulos, George Stamoulis, “Fault Injection Attacks Based on Layout-Driven SER Analysis”, 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), Published: [Official Link, Open Access Link]  
6. Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros, “Compact SER Models via Model Order Reduction of Diffusion-Based Charge Collection”, 2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), Published: [Official Link, Open Access Link]  
7. Carolina Imianosky, Douglas A. Santos, Luigi Dilillo, “Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector Extension”, 2025 10th International Workshop on Advances in Sensors and Interfaces (IWASI), Published: [Official Link, Open Access Link]   
8. Giuseppe Chessa, Elena Bellodi, Michele Favalli, Davide Zoni, Davide Bertozzi, “A Synthesis Toolflow for the Predictable Implementation of High-Performance Bundled-Data Asynchronous NoCs on FPGA”, 2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC),  Published: [Official Link, Open Access Link]  
9. Dimitrios Tsalapatas, Nikolaos Chatzivangelis, Christos Sotiriou, Nikolaos Sketopoulos, “Post-Placement Timing Optimisations on Asynchronous Designs”, 2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC), Published: [Official Link, Open Access Link]  
10. Konstantinos Varakliotis, Nikolaos Zazatis, Marko Andjelkovic, Nikolaos Chatzivangelis, Fabian Vargas, Milos Krstic, Christos Sotiriou, “Machine Learning Approach for Cross-Technology Prediction of the Generated Single Event Transient”, 2026 IEEE European Test Symposium (ETS), Published: [Official Link, Open Access Link] 
11. Nikolaos Chatzivangelis, Marios Karagiannis, Christos Georgakidis, Nikolaos Sketopoulos, Marko Andjelkovic, Luigi Dilillo, Christos Sotiriou, “STA-Based Single Event Transient Propagation in Advanced Technology Nodes”, 2026 IEEE European Test Symposium (ETS), Published: [Official Link, Open Access Link] 
12. Nikolaos Chatzivangelis, Nikolaos Betsos, Georgios-Ioannis Paliaroutis, Nikolaos Zazatis, Pelopidas Tsoumanis, Frederic Wrobel, Marko Andjelkovic, Christos Sotiriou, Luigi Dilillo, “Soft Error Reliability Analysis & Hardening of NVDLA MAC Units”, 2026 IEEE 44th VLSI Test Symposium (VTS), Published: [Official Link, Open Access Link] 
13. Nikolaos Zazatis, Alessandro Veronesi, Konstantinos Varakliotis, Pelopidas Tsoumanis, Christos Sotiriou, Leticia Maria Bolzani Pöhls, Marko Andjelkovic, Davide Bertozzi, “Cross-Layer Reliability Analysis of Slimmable Neural Networks under Permanent Faults”, 2026 IEEE 44th VLSI Test Symposium (VTS), Published: [Official Link, Open Access Link] 
14. Thiago H. Rausch, Wesley Grignani, Luigi Dilillo, Douglas R. Melo, “Resilience Analysis of a Fault-Tolerant MPSoC Interconnection Architecture Under SEU Fault Injection”, 2026 IEEE 27th Latin American Test Symposium (LATS), Published: [Official Link, Open Access Link] 
15. Douglas A. Santos, Wesley Grignani, Carolina Imianosky, Douglas R. Melo, Luigi Dilillo, “Design and Reliability Analysis of a Pipeline RISC-V Processor Core”, 2026 IEEE 27th Latin American Test Symposium (LATS), Published: [Official Link, Open Access Link] 
16. Wesley Grignani, Douglas A. Santos, Carolina Imianosky, Douglas R. Melo, Frédéric Wrobel, Luigi Dilillo, “Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA Under Proton Irradiation”, 2026 IEEE 27th Latin American Test Symposium (LATS), Published: [Official Link, Open Access Link] 
17. Iordana Gaisidou, Giuseppe Chessa, Giannis Giannoulas, Artur Jutman, Davide Bertozzi, Christos Sotiriou, “A Test Architecture for Bundled-Data Asynchronous NoC Switches Using Commercial ATPG Tools”, 2026 30th International Symposium on Asynchronous Circuits and Systems (ASYNC), Published: [Official Link, Open Access Link] 

 

JOURNALS

1. Zhe Su, Simone Ramini, Demetra Coffen Marcolin, Alessandro Veronesi, Milos Krstic, Giacomo Indiveri, Davide Bertozzi, Steven M. Nowick, “An Ultra-Low Cost and Multicast-Enabled Asynchronous NoC for Neuromorphic Edge Computing,” IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS), vol. 14, no. 3, pp. Sept. 2024. Published: [Official Link] 
2. Christos Georgakidis, Dimitris Valiantzas, Nikolaos Chatzivangelis, Marko Andjelkovic, Christos Sotiriou, Milos Krstic, “UPSET: A Comprehensive Probabilistic Single Event Transient Analysis Flow for VLSI Circuits Using Static Timing Analysis”,  MDPI/ Electronics 2026, Published: [Official Link, Open Access Link]  
3. Alexandra Takou, Georgios-Ioannis Paliaroutis, Pelopidas Tsoumanis, Marko Andjelkovic, Fabian Vargas,  Nestor Evmorfopoulos, George Stamoulis, “Efficient Reliability-Aware Hardware Trojan Design and Insertion for SET-Induced Soft Error Attacks”, MDPI/ Electronics 2026, Published: [Official Link, Open Access Link]  
4. Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros, “Temperature-aware compact SER modeling using model order reduction”, Microprocessors and Microsystems (2026): 105277. Published: [Official Link] 
5. Nikolaos Chatzivangelis, Georgios-Ioannis Paliaroutis, Wesley Grignani, Christos Sotiriou, Frederic Wrobel, Luigi Dilillo, “Reliability analysis of clock networks and critical paths under radiation-induced transients using custom simulation tools”, Microprocessors and Microsystems (2026): 105330. Published: [Official Link]