News
Dependability and test of systems and complex devices in radiation harsh environments.
We are thrilled to invite you to a lecture by TWIN-RELECT partner Prof.-Res. Luigi Dilillo (CNRS/IES – University of Montpellier) titled: “Dependability and test of systems and complex devices in radiation harsh environments.”. The lecture will take place on Friday, July 10, 2026, at 10:00 in Room 111 of the Department of Electrical and Computer Engineering, University of Thessaly, and you can register following the registration button below.
ABSTRACT:
Dependability and fault tolerance are critical challenges in modern electronic systems, especially as device scaling and complex architectures increase susceptibility to faults. These lectures provide a comprehensive overview of fundamental concepts in dependability, highlighting key obstacles and exploring a wide range of fault tolerance techniques. Various redundancy strategies—including information, hardware, temporal, software, and mixed approaches—are examined as essential methods to enhance system robustness.
A particular focus is placed on radiation-induced effects, especially Single Event Effects (SEEs). Memory systems are particularly addressed, including their structure, technology trends, and vulnerability to radiation induced errors. Radiation testing methodologies and bitmap-based statistical analysis are introduced to evaluate memory reliability.
The lectures further investigate reliability concerns in microcontrollers and FPGAs, analyzing architectural aspects and the impact of technology scaling. Advanced topics include low-observable systems, enhanced observability features, and emerging challenges in Artificial Intelligence hardware. In particular, the self-resilience of convolutional neural networks (CNNs), the reliability of AI accelerator modules, and the effects of radiation-induced soft errors on approximate computing systems are discussed.
Finally, the lectures will introduce the methodologies to make in field test in irradiation facilities.
PRESENTER:
Luigi Dilillo
Researcher CNRS/IES
Luigi Dilillo received his master's degree in Electronic Engineering from the Politecnico di Torino, Italy, in 2001, with specialization in Microelectronics. He received his Ph.D. degree in Information, Structures, and Systems from the University of Montpellier, France, in 2005. He did a post-doc at the University of Southampton, United Kingdom, from 2005 to 2007. He is currently a researcher and leader of RADIAC team at IES (University of Montpellier).
