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2nd Scientific Workshop on Fault-Tolerant Design and Real-Time Reliability Monitoring — Workshop Highlights



The 2nd TWIN-RELECT Scientific Workshop took place on July 13–15, 2026, at the Department of Electrical and Computer Engineering, University of Thessaly, Volos, Greece.

2nd-TWIN-RELECT-Scientific-Workshop


Over three days, researchers and engineers from across Europe gathered to discuss current challenges and developments in radiation effects, hardware reliability, fault tolerance, and chip design. The programme featured contributions from institutions including ESA, Politecnico di Milano, Testonica Lab, Brandenburg University of Technology, University of Ioannina, Democritus University of Thrace, and University of Thessaly, among others.


Topics covered included:

  • Radiation hardness assurance for space applications
  • Fault-tolerant design for AI accelerators
  • Reliability in next-generation memory architectures
  • High-level synthesis for secure and efficient chip design
  • Open-source EDA tools in modern microelectronics development
  • Error monitoring and hardening for RISC-V microcontrollers
  • Combined effects of ionizing and non-ionizing radiation

The workshop also included a PhD Forum, giving early-career researchers the opportunity to present their work and engage with the wider community.

The TWIN-RELECT project would like to thank all speakers and participants for their contributions, and the Department of Electrical and Computer Engineering, University of Thessaly, for hosting the event.